JPS63142771U - - Google Patents

Info

Publication number
JPS63142771U
JPS63142771U JP3474087U JP3474087U JPS63142771U JP S63142771 U JPS63142771 U JP S63142771U JP 3474087 U JP3474087 U JP 3474087U JP 3474087 U JP3474087 U JP 3474087U JP S63142771 U JPS63142771 U JP S63142771U
Authority
JP
Japan
Prior art keywords
test chamber
temperature characteristic
open part
slit curtain
small
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3474087U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0752625Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987034740U priority Critical patent/JPH0752625Y2/ja
Publication of JPS63142771U publication Critical patent/JPS63142771U/ja
Application granted granted Critical
Publication of JPH0752625Y2 publication Critical patent/JPH0752625Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP1987034740U 1987-03-10 1987-03-10 温度特性試験槽 Expired - Lifetime JPH0752625Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987034740U JPH0752625Y2 (ja) 1987-03-10 1987-03-10 温度特性試験槽

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987034740U JPH0752625Y2 (ja) 1987-03-10 1987-03-10 温度特性試験槽

Publications (2)

Publication Number Publication Date
JPS63142771U true JPS63142771U (en]) 1988-09-20
JPH0752625Y2 JPH0752625Y2 (ja) 1995-11-29

Family

ID=30843578

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987034740U Expired - Lifetime JPH0752625Y2 (ja) 1987-03-10 1987-03-10 温度特性試験槽

Country Status (1)

Country Link
JP (1) JPH0752625Y2 (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006275326A (ja) * 2005-03-28 2006-10-12 Sanyo Electric Co Ltd 恒温庫

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54143668A (en) * 1978-04-28 1979-11-09 Toshiba Corp Continuous environment testing apparatus
JPS5896241U (ja) * 1981-12-23 1983-06-30 ソニー株式会社 環境試験装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54143668A (en) * 1978-04-28 1979-11-09 Toshiba Corp Continuous environment testing apparatus
JPS5896241U (ja) * 1981-12-23 1983-06-30 ソニー株式会社 環境試験装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006275326A (ja) * 2005-03-28 2006-10-12 Sanyo Electric Co Ltd 恒温庫

Also Published As

Publication number Publication date
JPH0752625Y2 (ja) 1995-11-29

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